Lake Shore Cryotronics will be discussing its new, flexible Model 8425 Hall measurement system plus its range of industry-leading cryogenic probing and characterization solutions at the 2014 MRS Fall Exhibit, Dec. 2 – 4 in Boston.

The Model 8425 DC Hall system enables non-destructive testing of wafer-scale materials in a temperature-controlled, high-vacuum probing environment. The system combines the extensive Hall measurement capabilities of the company’s 8400 Series HMS with the flexibility and convenience of its CRX-VF cryogenic probe station, making it ideal for a number of materials research applications.

Because it includes a probe station, the Model 8425 allows researchers to measure Hall mobilities on wafers up to 51 mm in diameter, without needing to dice fabricated wafers as typically required in a Hall system. Also, because the sample is under vacuum, the platform is ideal for testing materials that are reactive to air or require initial warming to drive out moisture. In addition, multiple structures can be sampled on a wafer, including structures progressively built on substrates.

The Model 8425 supports DC fields to 2 T and temperature measurements from 10 K to 400 K using closed-cycle refrigerator (CCR) cooling. Lake Shore offers both cryogen-free CCR and liquid cryogen models, with configurations and options available for DC, RF, and microwave probing on full and partial wafers at various temperature ranges.

For attendees wanting to see a Lake Shore probe station up close, the company will have its Model TTPX set up in MRS Booth 701 during the exhibit. Visitors can also learn about Lake Shore’s fully configured TTPX version, the Model PS-100, which is designed for researchers in need of a highly capable cryogenic probe station at an affordable price.

Also at MRS Fall, Lake Shore will be discussing its:

• Other Hall effect systems, including its 8400 Series HMS with an AC field Hall measurement option for characterizing materials with very low mobilities.
• Magnetometer systems (VSM/AGMs) for characterizing magnetic properties of solid, thin film, powder, and liquid samples over a wide temperature range (4.2 K to 1273 K) and variable fields to >3 T.
• New terahertz (THz) characterization system that uses THz-frequency energy and an integrated cryostat to measure material responses across a range of frequencies, field strengths, and temperatures.
• New Model 372 AC resistance bridge and temperature controller, which is ideal for material characterization requiring measurements at cryogenic temperatures, particularly when measuring the extremely low impedances of superconducting materials.

For more information, visit MRS Booth 701.